Capacitance-Voltage / Drive-Level Capacitance Profiling

C-V / DLCP Analysis

Convert C-V and DLCP measurement files into graphs, then review Mott-Schottky fitting, DLCP Profile, and Density Profile results in one workflow.

Open C-V / DLCP Analysis Tool

Supported formats

.csv, .txt, .dat

Available analysis features

  • Mott-Schottky

    Transform C-V capacitance into 1/C^2-V form and review apparent Vbi, N_CV, fit window, and fit evidence.

    Mott-Schottky outputs depend on area, permittivity, voltage fit range, and linearity; review fit evidence before reporting Vbi or N_CV.

  • DLCP Profile

    Use AC-drive fitting or embedded NDL values to review N_DLCP by bias point and Vmax consistency.

    DLCP Profile values depend on AC-drive fitting or embedded NDL inputs and Vmax consistency; review bias-point evidence before comparison.

  • Density Profile

    Compare N_CV and N_DLCP across depletion depth to inspect depth-dependent carrier or trap response differences.

    Density Profile comparison depends on depth-unit settings and derived N_CV/N_DLCP values; confirm assumptions before interpreting trap or carrier trends.

What this tool can review

  • Capacitance curve visualization

    Load C-V, DLCP, or C-F capacitance rows and review measured capacitance behavior on the relevant voltage, drive, or frequency axis.

  • Mott-Schottky

    Transform C-V capacitance into 1/C^2-V form and review apparent Vbi, N_CV, selected fit window, and fit evidence.

  • DLCP Profile

    Review N_DLCP by bias point using AC-drive quadratic fitting or embedded NDL values, with Vmax consistency context.

  • Density Profile

    Compare N_CV and N_DLCP across depletion depth and inspect the summary values used for density-profile interpretation.

Typical use cases

  • Review C-V, DLCP, and C-F capacitance curves before result comparison.
  • Fit Mott-Schottky regions and inspect apparent Vbi, N_CV, fit range, and fit evidence.
  • Review N_DLCP by DLCP bias point using AC-drive fitting or embedded instrument values.
  • Compare N_CV and N_DLCP across depletion depth for density-profile review.

FAQ

What happens after I drop a C-V or DLCP file?

The measurement file is converted into a capacitance graph. From there, the workspace helps you review Mott-Schottky fitting, DLCP Profile results, and Density Profile comparison.

Can I adjust the calculation settings?

Yes. The workspace exposes area, permittivity, material-preset, fit-window, and depth-unit controls where those settings affect the selected C-V/DLCP result.

How are my measurement files handled?

Files uploaded to this analysis tool are processed in the current browser session for graph conversion and analysis. The tool does not send files outside or save them without user permission.

Supported workflow

  • Graph Conversion turns C-V, DLCP, and C-F capacitance data into graph views for curve review.
  • Mott-Schottky transforms C-V capacitance into 1/C^2-V form and reviews apparent Vbi, N_CV, fit range, and fit evidence.
  • DLCP Profile uses AC-drive fitting or embedded NDL values to review N_DLCP by bias point and Vmax consistency.
  • Density Profile compares N_CV and N_DLCP across depletion depth using the selected area, permittivity, and depth-unit settings.