X-ray Photoelectron Spectroscopy

XPS Analysis

Convert text-style XPS exports into source spectrum graphs and review binding-energy, intensity, and parser evidence before advanced analysis.

Open XPS Analysis Tool

Supported formats

.csv, .txt, .dat, .tsv, .xlsx

Available analysis features

  • Basic Graph

    Convert binding-energy and intensity columns into the source XPS spectrum so axis direction, peak position, and signal scale can be reviewed before fitting.

    Basic Graph preserves the parsed source spectrum; review axis type, energy direction, row quality, and primary peak evidence before fitting.

  • Survey Quantification

    Use survey-region areas, background handling, and RSF values to estimate atomic % and check element-ratio evidence before reporting.

    Survey Quantification depends on region area, background handling, RSF values, and include/exclude choices; verify each element before reporting atomic %.

  • Peak Fit

    Split selected XPS regions into peak components, then review center, FWHM, area, residual, and fit quality before reporting.

    Peak Fit values depend on selected regions, background model, seeded components, fixed overrides, and residual quality; review evidence before reporting.

  • Chemical-State Ratios

    Group fitted peak components into chemical states, then compare numerator and denominator groups as state fractions or ratios before reporting.

    Chemical-state ratios depend on fitted component grouping and denominator choice; confirm state labels and component areas before interpretation.

  • Interface Band Offset

    Combine XPS core-level centers with VBM and Eg inputs to calculate Kraut-style interface VBO, derived CBO, delta terms, and warning evidence.

    Interface Band Offset requires explicit Bulk A, Bulk B, and Interface A/B evidence; do not treat values as reportable unless the selected core levels, VBM inputs, bandgaps, and charge correction state are reviewed.

  • Data Review

    Inspect parser mapping, region metadata, duplicate energy points, and row-quality evidence before trusting the XPS file for quantification or fitting.

    Data Review is the traceability layer for XPS parsing; check region metadata, duplicate energies, parser warnings, and source row coverage.

What this tool can review

  • Source spectrum graph

    Load CSV/TXT/DAT/TSV rows with energy and intensity columns and render the original XPS spectrum in the shared graph workspace.

  • Source review summary

    Summarize row count, energy range, detected axis type, primary peak candidate, region count, and parser status.

  • Traceable raw export

    Export parsed source rows with file name, source row index, energy, intensity, and region label for follow-up review.

  • Survey quantification

    Estimate atomic % from survey regions using background handling, RSF values, and include/exclude controls.

  • Peak component review

    Inspect selected regions with background handling, seeded components, envelope, residual, and summary values for peak fitting.

  • Chemical-state ratios

    Group fitted peak components into chemical states and compare state fractions or ratios with a compact summary chart.

  • Data Review

    Review parsed region metadata, row counts, energy range, axis direction, duplicate energy points, and parser warnings before analysis.

Typical use cases

  • Review uploaded XPS binding-energy spectra before applying charge correction.
  • Check whether the spectrum axis is binding-energy or kinetic-energy style.
  • Compare visible source spectra with optional display-only Y offset.
  • Export source rows and first-pass spectrum summary values.

FAQ

What happens after I drop an XPS file?

The file is parsed into energy-intensity rows and converted into a source spectrum graph with row count, energy range, axis type, and primary peak evidence.

Does this calculate atomic % or chemical states?

Yes, in the analysis workspace. Survey quantification, peak fitting, and chemical-state ratios are available there, while the public discovery surface stays focused on source-spectrum review.

How are my measurement files handled?

Files uploaded to this analysis tool are processed in the current browser session for graph conversion and analysis. The tool does not send files outside or save them without user permission.

Supported workflow

  • Basic Graph turns supported XPS text-style files into binding-energy or kinetic-energy source spectra.
  • The summary reports source-review values only: row count, energy range, axis type, primary peak candidate, region count, and parser status.
  • Data Review checks parser mapping, region metadata, row counts, energy range, axis direction, and duplicate energy points in the analysis workspace.
  • Atomic %, peak fitting, and chemical-state ratios are available in the analysis workspace.