X-Ray Diffraction

XRD Analysis

Convert XRD measurement files into graphs, then review Peak Correction, Reference Peaks, FWHM / Scherrer, and FWHM / Williamson-Hall fitting in one workflow.

Open XRD Analysis Tool

Supported formats

.uxd, .udf, .dat, .csv, .xrdml, .xml, .raw, .rd

Available analysis features

  • Peak Correction

    Compare corrected 2θ positions and intensities using a substrate scan or reference peak basis.

    Correction results depend on the chosen substrate scan or reference basis; review corrected positions together with the original pattern before reporting.

  • Reference Peaks

    Use a library file provided by the user to create reference peak markers and compare them with measured XRD peaks.

    Reference markers are comparison aids from the user-provided library file and should be checked against sample composition and measured peak quality.

  • FWHM / Scherrer

    Fit selected peak widths and review Scherrer crystallite-size candidates with fitting evidence.

    Scherrer size is a candidate value because it depends on peak selection, fit quality, wavelength, and instrument-broadening assumptions.

  • FWHM / Williamson-Hall

    Regress multiple corrected peak-width values to review crystallite-size and microstrain candidates together.

    Williamson-Hall values are candidate results and should be reviewed with peak selection, correction quality, and regression evidence.

What this tool can review

  • Pattern visualization

    Load diffraction scans and convert them into 2θ-Intensity graphs for visual comparison.

  • Peak Correction

    Compare a sample scan against a substrate or reference peak basis and review corrected 2θ positions and intensities.

  • Reference Peaks

    Use a user-provided library file to create reference peak markers and compare them with measured XRD features.

  • FWHM / Scherrer

    Fit selected peak widths and review Scherrer crystallite-size candidates with fitting evidence.

  • FWHM / Williamson-Hall

    Use multiple corrected peak-width values to review crystallite-size and microstrain candidates on a Williamson-Hall plot.

Typical use cases

  • Review XRD patterns from thin films, powders, and material samples.
  • Compare multiple scans in one workspace before preparing figures or reports.
  • Convert measurement files into 2θ-Intensity graphs for fast review.
  • Use library-file based reference peaks to compare candidate peak positions with measured data.
  • Review Scherrer crystallite-size and Williamson-Hall crystallite-size/microstrain candidates from fitted peak widths.

FAQ

What happens after I drop an XRD file?

The measurement file is converted into a 2θ-Intensity graph. From there, the workspace helps you review Peak Correction, Reference Peaks, FWHM / Scherrer, and FWHM / Williamson-Hall fitting.

Can I use a library file for Reference Peaks?

Yes. Reference Peaks can use a library file provided by the user to create reference peak markers and compare them with the measured XRD pattern.

How are my measurement files handled?

Files uploaded to this analysis tool are processed in the current browser session for graph conversion and analysis. The tool does not send files outside or save them without user permission.

Supported workflow

  • Graph Conversion turns XRD measurement files into 2θ-Intensity views for pattern comparison.
  • Peak Correction compares corrected position and intensity behavior using a substrate scan or reference peak basis.
  • Reference Peaks uses a user-provided library file to compare candidate reference positions with measured peaks.
  • FWHM / Scherrer fits selected peak width and reviews crystallite-size candidates with fitting evidence.
  • FWHM / Williamson-Hall regresses multiple corrected peak-width values to review crystallite-size and microstrain candidates together.