Current-Voltage

IV Analysis

Convert I-V measurement files into graphs, then review Log I-V, diode (n·J0), resistance (Rs·Rsh), and light-dark comparison results in one workflow.

Open IV Analysis Tool

Supported formats

.txt, .log, .csv, .dat

Available analysis features

  • Log I-V

    Review absolute measured current on a log axis to compare leakage, rectification, and current span.

    Log I-V uses absolute measured current on a log axis; review polarity, current floor, and hidden negative values before interpreting leakage.

  • Diode (n·J0)

    Extract ideality factor n and saturation current J0 from the Hegedus corrected log plot, with checks and grades for each value.

    n and J0 come from the shunt- and series-resistance-corrected log plot and carry a grade; light-only values stay light estimates until a dark measurement confirms them.

  • Resistance (Rs·Rsh)

    Review g(V), r(J), and differential resistance to extract Rs and Rsh with Hegedus correction, apparent slopes, or a 1-Diode fit.

    Rsh comes from the flat reverse-bias g(V) and Rs from the r(J) intercept; apparent-slope and 1-Diode values are labeled, and a light-curve Rsh stays apparent.

  • Light·Dark Compare

    Pair light and dark files of the same cell, overlay the four Hegedus plots, and decide which n, J0, Rs, and Rsh to trust.

    The verdict needs a light and a dark measurement of the same cell; it separates collection loss, voltage-dependent leakage, and crossover before choosing the values to report.

What this tool can review

  • I-V curve visualization

    Load current-voltage measurements and review voltage-current-density curves with detected measurement-mode context.

  • Log I-V

    Plot measured voltage against absolute measured current on a log axis for leakage, rectification, and current-span review.

  • Diode (n·J0)

    Extract ideality factor n and saturation current J0 from the Hegedus corrected log plot; six checks grade each value as confirmed, light estimate, review, or undetermined.

  • Resistance (Rs·Rsh)

    Read Rsh from the flat reverse-bias g(V) and Rs from the r(J) intercept, or use apparent slopes or a Levenberg-Marquardt 1-Diode fit with standard errors.

  • Light·Dark Compare

    Overlay light and dark curves of the same cell in the four Hegedus plots and report the values the verdict supports.

  • Origin and Excel export

    Save J-V data in the JV Converter and macro layout for Origin, and an Excel summary with every value, its grade, method, window, and a Method sheet.

Typical use cases

  • Review light and dark I-V source curves before comparing calculated metrics.
  • Inspect absolute measured-current behavior on a logarithmic current axis.
  • Extract n and J0 from the shunt- and series-resistance-corrected log plot, with a grade for every value.
  • Compare shunt resistance and series resistance from Hegedus correction, apparent slopes, and a 1-Diode fit with standard errors.
  • Pair light and dark files of the same cell to separate collection loss, voltage-dependent leakage, and crossover.

FAQ

What happens after I drop an I-V file?

The measurement file is converted into a current-voltage graph. From there, the workspace helps you review Log I-V, corrected diode values (n, J0), resistances (Rs, Rsh), and light-dark pairs.

What can I inspect for light I-V files?

When light-curve inputs support it, the workspace summarizes values such as Voc, Jsc, FF, PCE, and maximum-power-point related results alongside the source curve.

How are my measurement files handled?

Files uploaded to this analysis tool are processed in the current browser session for graph conversion and analysis. The tool does not send files outside or save them without user permission.

Supported workflow

  • Graph Conversion turns I-V measurement files into current-voltage views for source-curve review.
  • Log I-V uses absolute measured current to compare leakage, rectification, and current dynamic range.
  • Diode (n·J0) extracts n and J0 from the Hegedus corrected log plot and grades each value from six checks.
  • Resistance (Rs·Rsh) reads Rsh from g(V) and Rs from r(J), with apparent-slope and 1-Diode alternatives.
  • Light·Dark Compare needs a light and a dark measurement of the same cell to confirm values measured under light.